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Comparison of Integral Equation Predictions and Experimental Backscatter Measurements from Random Conducting Rough Surfaces

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Comparison of Integral Equation Predictions and Experimental Backscatter Measurements from Random Conducting Rough Surfaces

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dc.contributor.author Nance, C.E.
dc.contributor.author Fung, Adrian K.
dc.contributor.author Bredow, Jonathan W.
dc.date.accessioned 2010-08-03T21:58:53Z
dc.date.available 2010-08-03T21:58:53Z
dc.date.issued 1990-05
dc.identifier.citation Geoscience and Remote Sensing Symposium, 1990. IGARSS '90. 'Remote Sensing Science for the Nineties'., 10th Annual International , vol. 2, pp.477-480, 20-24 May 1990
dc.identifier.uri http://hdl.handle.net/10106/4980
dc.description.abstract The scattering behavior from randomly rough surface targets has been analyzed by comparing the predictions of an integral equation model for surface scattering (Li and Fung, PIERS' 89, pg.144)to experimental data. This model has also been checked by numerical simulation (Chen and Chen, IGARSS' 89, pg.1300). Experimental data was taken for the purpose of the comparison of trends and levels of scattering strength versus frequency, incidence angle, and polarization. The surface parameters chosen will allow comparison in the low frequency region, the intermediate frequency region, and into the physical optics limit. Two of the targets were constructed by a numerically controlled mill to produce surfaces with predefined statistical characteristics. The third target is a two scale surface, constructed by hammering an aluminum plate. The statistics for this surface were compiled after the construction. en_US
dc.description.sponsorship IEEE Geoscience and Remote Sensing Symposium en_US
dc.description.sponsorship Wave Scattering Research Center
dc.description.sponsorship University of Texas at Arlington en_US
dc.language.iso en_US en_US
dc.publisher IEEE en_US
dc.subject Scattering en_US
dc.subject Rough Surface en_US
dc.subject Backscatter en_US
dc.title Comparison of Integral Equation Predictions and Experimental Backscatter Measurements from Random Conducting Rough Surfaces en_US
dc.type Article

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