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Efficiency Contours for Estimators of Reliability in a 2-Parameter Exponential Failure Model

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Efficiency Contours for Estimators of Reliability in a 2-Parameter Exponential Failure Model

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dc.contributor.author Lu, I-Le en
dc.contributor.author Dyer, Danny D. en
dc.date.accessioned 2010-06-03T15:20:42Z en
dc.date.available 2010-06-03T15:20:42Z en
dc.date.issued 1977-05 en
dc.identifier.uri http://hdl.handle.net/10106/2290 en
dc.description.abstract When there are available several point estimators of some parametric function, it would seem desirable to make a comparison among the estimators based on some measure of closeness to the true value. Along these lines, the concept of Pitman-closeness (PC) efficiency is introduced. Essentially, when comparing two estimators, PC efficiency gives the odds in favor of one of the estimators being closer to the true value in a given situation than is the other. The traditional method of comparison, i.e., mean squared (MS) efficiency is also considered. This paper presents graphical results based on simulation techniques which depict PC efficiencies as well as MS efficiencies of the following estimators of the reliability function R(t) of a 2-parameter exponential failure model: (i) the maximum likelihood estimator(R ^_MLE (t)), (ii) the minimum variance unbiased estimator (R ^_MVUE (t)) and (iii) a Bayesian/structural estimator (R ^_SE (t)). Based on the graphs, R ^_SE (t) is, in general, preferred (in the sense of having the best chance of being closest to the true value of R(t)) except (a) when R(t) is very high, in which case (R ^_MLE (t)) is preferred, and (b) when R(t) is moderate and the sample size is small to moderate, in which case R ^_MVUE (t) is preferred. en
dc.language.iso en_US en
dc.publisher University of Texas at Arlington en
dc.relation.ispartofseries Technical Report;61 en
dc.subject Pitman-closeness efficiency en
dc.subject Mean square en
dc.subject Estimators of reliability en
dc.subject Failure model en
dc.subject 2-Parameter Exponential en
dc.subject.lcsh Mathematical statistics en
dc.subject.lcsh Mathematics Research en
dc.title Efficiency Contours for Estimators of Reliability in a 2-Parameter Exponential Failure Model en
dc.type Technical Report en
dc.publisher.department Department of Mathematics en

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