Analysis And Characterization Of Thermal Effects In Analog Circuits

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Analysis And Characterization Of Thermal Effects In Analog Circuits

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dc.contributor.author Chaugule, Abhijit Avinash en_US
dc.date.accessioned 2007-08-23T01:55:57Z
dc.date.available 2007-08-23T01:55:57Z
dc.date.issued 2007-08-23T01:55:57Z
dc.date.submitted December 2005 en_US
dc.identifier.other DISS-1200 en_US
dc.identifier.uri http://hdl.handle.net/10106/38
dc.description.abstract Dielectrically Isolated Bipolar Junction Transistors (DIBJTs) are used in industry for high speed and high power applications. These devices suffer from thermal heating and are subjected to change in their characteristics. This thesis explores the thermal effects involving the self heating and inter-device heating (thermal coupling) at the device as well as at the circuit level. Systematic analysis of individual device heating characteristics in a particular Current feedback operational amplifier (CFOA) design is carried out, using the VBIC (Vertical Bipolar Inter-company) model in the the Cadence SpectreS simulator. A diagnostic and design procedure is established for circuit designers to determine the possible causes of the thermal tail and to eliminate the problem. To consider the inter-device heating effects, a BJT symbol including adjacent device heating in the VBIC model is developed at the schematic capture level. Different test structures are developed, and fabricated using National Semiconductor process to study dependence of inter-device heating of DIBJTs on various layout factors. An innovative method for the inter-device heating measurement is developed using IC-CAP / HPIB interfaced evaluation system. en_US
dc.description.provenance Made available in DSpace on 2007-08-23T01:55:57Z (GMT). No. of bitstreams: 1 umi-uta-1200.pdf: 1439801 bytes, checksum: e15a42dfa9b921a1adcd35bba7e2d595 (MD5) en
dc.description.sponsorship Carter, Ronald en_US
dc.language.iso EN en_US
dc.publisher Electrical Engineering en_US
dc.title Analysis And Characterization Of Thermal Effects In Analog Circuits en_US
dc.type M.S.E.E. en_US
dc.contributor.committeeChair Carter, Ronald en_US
dc.degree.department Electrical Engineering en_US
dc.degree.discipline Electrical Engineering en_US
dc.degree.grantor University of Texas at Arlington en_US
dc.degree.level masters en_US
dc.degree.name M.S.E.E. en_US

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